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Publications

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Filters: First Letter Of Last Name is O and Author is Oe, Takehiko  [Clear All Filters]
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O
Comparison Between NIST Graphene and AIST GaAs Quantized Hall Devices, T. Oe, A. F. Rigosi, M. Kruskopf, B-Y. Wu, H-Y. Lee, Y. Yang, R. E. Elmquist, N-hisa. Kaneko, and D. G. Jarrett , IEEE Trans. Instrum. Meas., 69, 3103–3108 (2020)