|Title||Two-Terminal and Multi-Terminal Designs for Next-Generation Quantized Hall Resistance Standards: Contact Material and Geometry|
|Publication Type||Journal Article|
|Year of Publication||2019|
|Authors||M. Kruskopf, A. F. Rigosi, A. R. Panna, D. K. Patel, H. Jin, M. Marzano, M. Berilla, D. B. Newell, and R. E. Elmquist|
|Journal||IEEE Trans. Electron Devices|
|Type of Article||Article|
|Keywords||Epitaxial graphene (EG), multi-series (MS) contacts, quantized Hall resistance (QHR) standards, quantum Hall effect (QHE), superconducting contacts|
In this paper, we show that quantum Hall resistance measurements using two terminals may be as precise as four-terminal measurements when applying superconducting split contacts. The described sample designs eliminate resistance contributions of terminals and contacts such that the size and complexity of next-generation quantized Hall resistance devices can be significantly improved.