| Title | Two-Terminal and Multi-Terminal Designs for Next-Generation Quantized Hall Resistance Standards: Contact Material and Geometry |
| Publication Type | Journal Article |
| Year of Publication | 2019 |
| Authors | M. Kruskopf, A. F. Rigosi, A. R. Panna, D. K. Patel, H. Jin, M. Marzano, M. Berilla, D. B. Newell, and R. E. Elmquist |
| Journal | IEEE Trans. Electron Devices |
| Volume | 66 |
| Pagination | 3973-3977 |
| Date Published | SEP |
| Type of Article | Article |
| ISSN | 0018-9383 |
| Keywords | Epitaxial graphene (EG), multi-series (MS) contacts, quantized Hall resistance (QHR) standards, quantum Hall effect (QHE), superconducting contacts |
| Abstract | In this paper, we show that quantum Hall resistance measurements using two terminals may be as precise as four-terminal measurements when applying superconducting split contacts. The described sample designs eliminate resistance contributions of terminals and contacts such that the size and complexity of next-generation quantized Hall resistance devices can be significantly improved. |
| DOI | 10.1109/TED.2019.2926684 |
