| Title | Epitaxial graphene for quantum resistance metrology |
| Publication Type | Journal Article |
| Year of Publication | 2018 |
| Authors | M. Kruskopf, and R. E. Elmquist |
| Journal | METROLOGIA |
| Volume | 55 |
| Pagination | R27-R36 |
| Date Published | AUG |
| ISSN | 0026-1394 |
| Keywords | epitaxial graphene, quantum Hall effect, quantum resistance metrology |
| DOI | 10.1088/1681-7575/aacd23 |
