| Title | Effect of device design on charge offset drift in Si/SiO2 single electron devices |
| Publication Type | Journal Article |
| Year of Publication | 2018 |
| Authors | B. Hu, E. D. Ochoa, D. Sanchez, J. K. Perron, N. M. Zimmerman, and |
| Journal | JOURNAL OF APPLIED PHYSICS |
| Volume | 124 |
| Pagination | 144302 |
| Date Published | OCT 14 |
| ISSN | 0021-8979 |
| DOI | 10.1063/1.5048013 |
